Slab Module

Using the Slab Measurement Module, wafers, sheets or slabs of high-conductivity materials can be tested. Among the samples suitable for testing with this method we find e.g. metals, semi-conductors and graphite. With prior knowledge of the sample thickness, this method requires only measurement time and output power as in-data, making it very easy and straightforward to work with.

The Slab Measurement Module requires two sample halves for accurate measurements.